Note: Multiscale scanning probe microscopy

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Note: Multiscale scanning probe microscopy.

Combining the nanoscopic and macroscopic worlds is a serious challenge common to numerous scientific fields, from physics to biology. In this paper, we demonstrate nanometric resolution over a millimeter range by means of atomic-force microscopy using metrological stage. Nanometric repeatability and millimeter range open up the possibility of probing components and materials combining multiscal...

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Scanning hall probe microscopy technique for investigation of magnetic properties

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Scanning probe microscopy.

During the past year, scanning probe microscopy, especially atomic force microscopy (AFM), has taken root in the biological sciences community, as is evident from the large number of publications and from the variety of specialized journals in which these papers appear. Furthermore, there is a strong indication that the technique is evolving from a qualitative imaging tool to a probe of the cri...

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ژورنال

عنوان ژورنال: Review of Scientific Instruments

سال: 2010

ISSN: 0034-6748,1089-7623

DOI: 10.1063/1.3473935